TY  - GEN
AU  - Peiser, H Steffen
AU  - Sangster, Raymond C
AU  - Jung, Wun
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1979-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.SP.539
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1979
TI  - Metrology in industry and government:
ER  -