TY  - GEN
AU  - Zimmerman, James Edward
AU  - Sullivan, D B
AU  - McCarthy, S E
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1981-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.SP.607
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1981
TI  - Refrigeration for cryogenic sensors and electronic systems:
ER  -