TY  - GEN
AU  - Ku, Harry H
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1988-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.SP.747
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1988
TI  - Statistical concepts in metrology:
ER  -