TY  - GEN
AU  - McCowan, C N
AU  - Wang, C-M
AU  - Splett, J D
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2008-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.SP.960-18e2
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2008
TI  - NIST recommended practice guide:Computing uncertainty for charpy impact machine test results (2008 edition)
ER  -