TY  - GEN
AU  - M L Crawford
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1981-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.TN.1013
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1981
TI  - Using a TEM cell for EMC measurements of electronic equipment:
ER  -