TY  - GEN
AU  - John W Gramlich
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1982-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.TN.1154
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1982
TI  - A programmable sample dryer for thermal ionization mass spectrometry:
ER  -