TY  - GEN
AU  - Eckerle, Kenneth L
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1983-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.TN.1175
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1983
TI  - Extension of a reference spectrophotometer into the near infrared:
ER  -