TY  - GEN
AU  - H Steffen Peiser
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1963-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.TN.174
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1963
TI  - Research on crystal growth and defect characterization at the National Bureau of Standards during the period July to December 1962:
ER  -