TY  - GEN
AU  - Hsia, Jack J
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1975-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.TN.594-10
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1975
TI  - Optical radiation measurements ::the NBS 20-, 60-, and 85- degree specular gloss scales
ER  -