TY  - GEN
AU  - R A Kamper
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1972-01-01 05:01:00
DO  - https://doi.org/10.6028/NBS.TN.630
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1972
TI  - Developments in Cryoelectronics:
ER  -