TY  - GEN
AU  - Jr Hedberg
AU  - Moneer Helu
AU  - Sylvere Krima
AU  - Allison Barnard Feeney
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2020-07-01 04:07:00
DO  - https://doi.org/10.6028/NIST.AMS.300-10
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2020
TI  - Recommendations on ensuring traceability and trustworthiness of manufacturing-related data:
ER  -