TY  - GEN
AU  - Anthony Breitzman
AU  - Patrick Thomas
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2016-10-01 04:10:00
DO  - https://doi.org/10.6028/NIST.GCR.16-009
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2016
TI  - An Analysis of References from US Patents to NIST-Supported Technical Outputs:
ER  -