TY  - GEN
AU  - Marshall, J C
AU  - Cresswell, M W
AU  - Ellenwool, C H
AU  - Linholm, L W
AU  - Roitman, P
AU  - Zaghloul, M E
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1993-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.4890
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1993
TI  - The test guide for CMOS-ON-SIMOX test chips NIST3 and NIST4:
ER  -