TY  - CONF
AU  - Theodore Vorburger
AU  - Ronald Dixson
AU  - Joseph Fu
AU  - Ndubuisi Orji
AU  - Shaw Feng
AU  - Michael Cresswell
AU  - Richard Allen
AU  - William Guthrie
AU  - Wei Chu
C2  - Proc. 5th Int. Conf. on Precision, Meso, Micro, and Nano Engineering (COPEN 2007) (Allied Publishers Pvt. Ltd, Chennai, 2007), Trivandrum, IN
DA  - 2007-12-14
LA  - en
PB  - Proc. 5th Int. Conf. on Precision, Meso, Micro, and Nano Engineering (COPEN 2007) (Allied Publishers Pvt. Ltd, Chennai, 2007), Trivandrum, IN
PY  - 2007
TI  - Nano- and Atomic-Scale Length Metrology
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=824603
ER  -