TY  - JOUR
AU  - Mielenz, Klaus
AU  - Eckerle, K
C2  - Applied Optics
DA  - 1972-10-01
LA  - en
M1  - 11
PB  - Applied Optics
PY  - 1972
TI  - Spectrophotometer Linearity Testing Using the Double-Aperture Method
ER  -