TY  - GEN
AU  - Y Tina Lee
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1995-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.5727
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1995
TI  - Extensions of the prototype application protocol of ready-to-wear apparel pattern making:
ER  -