TY - GEN AU - Lee, Y Tina C2 - , National Institute of Standards and Technology, Gaithersburg, MD DA - 1995-01-01 05:01:00 DO - https://doi.org/10.6028/NIST.IR.5727 LA - en PB - , National Institute of Standards and Technology, Gaithersburg, MD PY - 1995 TI - Extensions of the prototype application protocol of ready-to-wear apparel pattern making: ER -