TY  - GEN
AU  - Stephen Knight
AU  - Alice D Settle-Raskin
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1997-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.5851r1997
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1997
TI  - National Semiconductor Metrology Program::project portfolio, FY 1997
ER  -