TY  - GEN
AU  - Craig Schlenoff
AU  - Peter Denno
AU  - Don Libes
AU  - Simon Szykman
AU  - Robert Ivester
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1999-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.6301
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1999
TI  - An analysis of existing ontological systems for applications in manufacturing and healthcare:
ER  -