TY - GEN AU - R Sudarsan AU - U Roy AU - Y Narahari AU - RD Sriram AU - K W Lyons AU - N Pramanik C2 - , National Institute of Standards and Technology, Gaithersburg, MD DA - 2000-01-01 05:01:00 DO - https://doi.org/10.6028/NIST.IR.6524 LA - en PB - , National Institute of Standards and Technology, Gaithersburg, MD PY - 2000 TI - Information models for design tolerancing::from conceptual to the detail design ER -