TY  - GEN
AU  - C L Wilson
AU  - M D Garris
AU  - C I Watson
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2004-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.IR.7110
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2004
TI  - Matching performance for the US-VISIT IDENT system using flat fingerprints:
ER  -