TY  - GEN
AU  - Lee, Y.
AU  - Filliben, J.J
AU  - Michaels, R.J.
AU  - Phillips, P.J.
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2012-05-01 04:05:00
DO  - https://doi.org/10.6028/NIST.IR.7855
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2012
TI  - Sensitivity Analysis for Biometric Systems: A Methodology Based on Orthogonal Experiment Designs:
ER  -