TY  - GEN
AU  - Grother, Patrick
AU  - Ngan, Mei
AU  - Hanaoka, Kayee
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2019-12-01 05:12:00
DO  - https://doi.org/10.6028/NIST.IR.8280
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2019
TI  - Face recognition vendor test part 3::demographic effects
ER  -