TY  - GEN
AU  - Y May Chang
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2000-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.SP.250-52
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2000
TI  - Error analysis and calibration uncertainty of capacitance standards at NIST:
ER  -