TY  - GEN
AU  - Croarkin, M C
AU  - Ehrstein, J R
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1997-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.SP.260-131
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1997
TI  - Standard Reference Materials ::The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements/
ER  -