TY - GEN AU - Carlos R Beauchamp AU - Johanna E Camara AU - Jennifer Carney AU - Steven J Choquette AU - Kenneth D Cole AU - Paul C DeRose AU - David L Duewer AU - Michael S Epstein AU - Margaret C Kline AU - Katrice A Lippa AU - Enrico Lucon AU - Karen W Phinney AU - Maria Polakoski AU - Antonio Possolo AU - Katherine E Sharpless AU - John R Sieber C2 - , National Institute of Standards and Technology, Gaithersburg, MD DA - 2020-07-01 04:07:00 DO - https://doi.org/10.6028/NIST.SP.260-136-2020 LA - en PB - , National Institute of Standards and Technology, Gaithersburg, MD PY - 2020 TI - Metrological tools for the reference materials and reference instruments of the NIST material measurement laboratory: ER -