TY  - GEN
AU  - Haykin, Martha E
AU  - Warnar, Robert B J
C2  - , National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1988-01-01 05:01:00
DO  - https://doi.org/10.6028/NIST.SP.500-157
LA  - en
PB  - , National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1988
TI  - Smart card technology:
ER  -