TY  - SER
AU  - John Suehle
C2  - CRC Press, Boca Raton, FL
DA  - 2009-01-14
LA  - en
PB  - CRC Press, Boca Raton, FL
PY  - 2009
TI  - Wear-out and Time Dependent Dielectric Breakdown in Silicon Oxides
ER  -