TY  - CONF
AU  - Ndubuisi Orji
AU  - Ronald Dixson
AU  - Hiroshi Itoh
AU  - Chumei Wang
C2  - SPIE Proc. Instrumentation, Metrology, and Standards for Nanomanufacturing Vol. 9173, San Diego, CA
DA  - 2014-09-15
LA  - en
PB  - SPIE Proc. Instrumentation, Metrology, and Standards for Nanomanufacturing Vol. 9173, San Diego, CA
PY  - 2014
TI  - Technique for AFM Tip Characterization
ER  -