TY  - JOUR
AU  - Pragya Shrestha
AU  - Kin Cheung
AU  - Jason Campbell
AU  - Jason Ryan
AU  - Helmut Baumgart
C2  - IEEE Transactions on Electron Devices
DA  - 2014-07-01
LA  - en
PB  - IEEE Transactions on Electron Devices
PY  - 2014
TI  - Accurate Fast Capacitance Measurements for Reliable Device Characterization
ER  -