TY  - CONF
AU  - Martin Chiang
AU  - R Song
AU  - Alamgir Karim
AU  - Eric Amis
C2  - Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show | | |
DA  - 2003-05-01
LA  - en
M1  - 19(7)
PB  - Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show | | |
PY  - 2003
TI  - Multivariant Measurement for Thin Film Adhesion as a Function of Temperature and Thin Film Thickness
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852168
ER  -