TY  - JOUR
AU  - Christine Mahoney
AU  - Albert Fahey
AU  - John Gillen
AU  - Chang Xu
AU  - James Batteas
C2  - Analytical Chemistry
DA  - 2007-02-01
LA  - en
PB  - Analytical Chemistry
PY  - 2007
TI  - Temperature-Controlled Depth Profiling in Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of Sputter-Induced Topography, Chemical Damage and Depolymerization Effects
ER  -