@article{936741,
  author = {Stephen Moxim and James P Ashton and Mark Anders and Jason Ryan},
  title = {Combining Electrically Detected Magnetic Resonance Techniques to Study Atomic-Scale Defects Generated by Hot-Carrier Stressing in HfO2/SiO2/Si Transistors},
  year = {2023},
  number = {133},
  month = {2023-04-12 04:04:00},
  publisher = {Journal of Applied Physics},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936117},
  doi = {https://doi.org/10.1063/5.0145937},
  language = {en},
}