@article{932286,
  author = {Nicholas Ritchie and Dale E. Newbury and Jeffrey Davis},
  title = {EDS measurements of x-ray intensity at WDS precision and accuracy using a silicon drift detector},
  year = {2012},
  number = {18},
  month = {2012-07-30 04:07:00},
  publisher = {Microscopy and Microanalysis},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=908839},
  doi = {https://doi.org/10.1017/S1431927612001109},
  language = {en},
}