@article{924296,
  author = {Donald Windover and David Gil and Yasushi Azuma and Toshiyuki Fujimoto},
  title = {Determining sample alignment in X-ray Reflectometry using thickness and density from GaAs/AlAs multilayer certified reference materials},
  year = {2014},
  number = {25},
  month = {2014-09-08 04:09:00},
  publisher = {Measurement Science & Technology},
  doi = {https://doi.org/10.1088/0957-0233/25/10/105007},
  language = {en},
}