@conference{920556, author = {Vivian Wong and Max Ferguson and Kincho Law and Yung-Tsun Lee and Paul Witherell}, title = {Segmentation of Addictive Manufacturing Defects Using U-Net}, year = {2021}, month = {2021-08-17 04:08:00}, publisher = {ASME 2021 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference IDETC/CIE2021 , Online, Virtual, MD, US}, url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=932117}, doi = {https://doi.org/10.1115/DETC2021-68885}, language = {en}, }