@article{915796,
  author = {Yaw S. Obeng and Kevin J. Coakley and Pavel Kabos and Stephane Moreau},
  title = {Understanding Early Failure Behavior In 3D-Interconnects: Empirical Modeling of Broadband Signal Losses In TSV-Enabled Interconnects},
  year = {2022},
  number = {69},
  month = {2022-11-01 04:11:00},
  publisher = {IEEE Transactions on Electron Devices},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=933639},
  doi = {https://doi.org/10.1109/TED.2022.3204936},
  language = {en},
}