@conference{914246,
  author = {Papa Amoah and Joseph J. Kopanski and Yaw S. Obeng and Christopher Sunday and Chukwudi Okoro and Lin You and Dmirty Veksler},
  title = {Towards the Physical Reliability of 3D-Integrated Systems: Broadband Dielectric Spectroscopic (BDS) Studies of Material Evolution and Reliability in Integrated Systems},
  year = {2022},
  number = {109},
  month = {2022-09-30 04:09:00},
  publisher = {ECS Transactions, volume 109 (issue 2), Atlanta, GA, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935248},
  doi = {https://doi.org/10.1149/10902.0041ecst},
  language = {en},
}