@conference{876911,
  author = {Jason Holm and Bob Keller},
  title = {Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector},
  year = {2015},
  number = {21 (Suppl 3)},
  month = {2015-08-06 04:08:00},
  publisher = {Microscopy & Microanalysis 2015 Meeting, Portland, OR, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=918051},
  doi = {https://doi.org/10.1017/S1431927615010119},
  language = {en},
}