@conference{875131,
  author = {Joseph Kopanski and Lin You},
  title = {Electric Field Gradient Reference Material for Scanning Probe Microscopy},
  year = {2019},
  month = {2019-03-31 04:03:00},
  publisher = {Proceedings of the 2019 International Conference on Frontiers of Characterization and Metrology 
for Nanoelectronics, Monterey, CA, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927329},
  language = {en},
}