@conference{871501,
  author = {John Villarrubia and Vipin Tondare and Andras Vladar},
  title = {Assessing Scanning Electron Microscopy Stereophotogrammetry Algorithms with Virtual Test Samples},
  year = {2017},
  month = {2017-03-20 04:03:00},
  publisher = {Frontiers of Characterization and Metrology for Nanoelectronics 2017, Monterey, CA, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922328},
  language = {en},
}