@conference{870471,
  author = {Dmitry Veksler and Jason Campbell and Kin Cheung and J. Zhong and H. Zhu and C. Zhao},
  title = {Device-Level Jitter as a Probe of Ultrafast Traps in High-k MOSFETs},
  year = {2016},
  month = {2016-04-16 04:04:00},
  publisher = {proceedings of 2016 IEEE International Reliability Physics Symposium, Pasadena, CA, US},
  language = {en},
}