@conference{868581,
  author = {Zakariae Chbili and Kin Cheung and Jason Campbell and Jaafar Chbili and Mhamed Lahbabi and D. Ioannou and Kevin Matocha},
  title = {Time Dependent Dielectric Breakdown in high quality SiC MOS capacitors},
  year = {2016},
  number = {858},
  month = {2016-05-23 04:05:00},
  publisher = {Silicon Carbide and Related Materials , Giardini Naxos, IT},
  language = {en},
}