@article{86731,
  author = {Dean Jarrett and Randolph Elmquist and Nien Zhang and Alejandra Tonina and M Porfiri and Janice Fernandes and H Schechter and Daniel Izquierdo and C Faverio and Daniel Slomovitz and Dave Inglis and Kai Wendler and Felipe Hernandez-Marquez and B Rodriguez},
  title = {SIM Comparison of DC Resistance Standards at 1 {Ω}, 1 M{Ω}, and 1 G{Ω}},
  year = {2009},
  month = {2009-01-01},
  publisher = {IEEE Transactions on Instrumentation and Measurement},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33141},
  language = {en},
}