@conference{847671,
  author = {Parrish Ralston and Tam Duong and Nanying Yang and David Berning and Colleen Hood and Allen Hefner Jr. and Kathleen Meehan},
  title = {High-Voltage Capacitance Measurement System for SiC Power MOSFETs},
  year = {2009},
  month = {2009-09-24 00:09:00},
  publisher = {2009 IEEE Energy Conversion Congress and Exposition, San Jose, CA, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=903137},
  language = {en},
}