@conference{847396,
  author = {Allen Hefner Jr. and David Berning and David Blackburn and Christophe Chapuy and Sebastien Bouche},
  title = {A High-Speed Thermal Imaging System for Semiconductor Device Analysis},
  year = {2001},
  month = {2001-04-01 00:04:00},
  publisher = {Proc., Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, San Jose, CA, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=15525},
  language = {en},
}