@conference{847356,
  author = {Allen Hefner Jr. and Ty McNutt and David Berning and Ranbir Singh and Adwoa Akuffo},
  title = {The Role of Carrier Lifetime in Forward Bias Degradation of 4H-SiC PiN Diodes},
  year = {2003},
  month = {2003-10-05 00:10:00},
  publisher = {Proceedings of ICSREM 2003, France, 1, FR},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31552},
  language = {en},
}