@article{846471,
  author = {John Suehle and Harry Schafft},
  title = {Techniques and Characterization of Pulsed Electromigration at the Wafer Level},
  year = {1992},
  number = {32},
  month = {1992-11-01 00:11:00},
  publisher = {Microelectronics Reliability},
  language = {en},
}