@conference{846461,
  author = {Bin Wang and John Suehle and Eric Vogel and J. Conley and C Weintraub and A. Johnston and J Bernstein},
  title = {Latent Reliability Degradation of Ultra-Thin Oxides after Heavy Ion and Gamma Ray Irradiation},
  year = {2001},
  month = {2001-10-18 00:10:00},
  publisher = {IEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA},
  language = {en},
}