@conference{846076,
  author = {Joseph Kopanski and David Blackburn and George Harman and David Berning},
  title = {Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits},
  year = {1996},
  month = {1996-01-20 00:01:00},
  publisher = {Proc., IEEE Components, Packaging, and Manufacturing Technology Society, San Diego, CA, USA},
  language = {en},
}