@conference{845796,
  author = {Bin Wang and John Suehle and Eric Vogel and J Bernstein},
  title = {The Effect of Stress Interruption and Pulsed Biased Stress on Ultra-Thin Gate Dielectric Reliability},
  year = {2000},
  month = {2000-12-31 00:12:00},
  publisher = {2000 IIEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA},
  language = {en},
}